HI-Q®RF TEST AND MEASUREMENT SYSTEM
HI-Q®RF Test Measurement System (TMS) utilizes microwave photonics techniques for automated measurement of ultra-low phase noise oscillators.
OEwaves’ HI-Q®RF Test Measurement System (TMS)
is fast and fully automated and yields the spectral density of the phase noise of an RF or microwave signal source at any operating frequency in the specified bands.
This homodyne-based system is unique in wide frequency band measurement without requiring another low noise reference source or down-converter, as required in conventional heterodyne approaches. The system operates with ease, speed, and precision using a simple graphic user interface via a notebook PC.
Ultra-Low Absolute Phase Noise/Jitter Measurement Capability
Fast Real-time Measurement
Cross-Correlation Homodyne Capability
No Low Noise Reference Source Required
User Friendly Interface
Simple PC-based Operation
6U x 19” Rack System
Customizable Configurations, Upgrades, and Options